Relevance of length scales in exchange biased submicron dots

dc.contributor.author	Li, Zhi-Pan
dc.contributor.author	Morales Arboleya, Rafael
dc.contributor.author	Schuller, Ivan K.
dc.date.accessioned	2013-01-30T09:59:54Z
dc.date.available	2013-01-30T09:59:54Z
dc.date.issued	2009
dc.identifier.citation	Applied Physics Letters, 94(14), 142503(2009); doi:10.1063/1.3114372	eng
dc.identifier.issn	0003-6951
dc.identifier.uri	http://hdl.handle.net/10651/6776
dc.language.iso	eng
dc.relation.ispartof	Applied Physics Letters	eng
dc.rights	© American Institute of Physics
dc.source	SCOPUS	spa
dc.source.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-64349122940&partnerID=40
dc.title	Relevance of length scales in exchange biased submicron dots	eng
dc.type	journal article
dc.identifier.local	20090638	spa
dc.identifier.doi	10.1063/1.3114372
dc.relation.publisherversion	http://dx.doi.org/10.1063/1.3114372	spa

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