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Please use this identifier to cite or link to this item: http://hdl.handle.net/10651/51020

Title: A Synthetic Aperture Radar (SAR)-Based Technique for Microwave Imaging and Material Characterization
Author(s): Álvarez López, Yuri
García Fernández, María
Grau, Raphael
Las Heras Andrés, Fernando Luis
Keywords: imaging
synthetic aperture radar
caracterización materiales
Issue date: Dec-2018
Publisher: MDPI
Publisher version: https://doi.org/10.3390/electronics7120373
Citation: Electronics, 7(12), p. 373- (2018)
Format extent: p. 373-
Abstract: This contribution presents a simple and fast Synthetic Aperture Radar (SAR)-based technique for microwave imaging and material characterization from microwave measurements acquired in tomographic systems. SAR backpropagation is one of the simplest and fastest techniques for microwave imaging. However, in the case of heterogeneous objects and media, a priori information about the constitutive parameters (conductivity, permittivity) is needed for an accurate imaging. In some cases, a first guess of the constitutive parameters can be extracted from an uncorrected SAR image, and then the estimated parameters can be introduced in a second step to correct the SAR image. The main advantage of this methodology is that there is little or no need for a priori information about the object to be imaged. Besides, calculation time is not significantly increased with respect to conventional SAR, thus allowing real-time imaging capabilities. The methodology has been validated by means of measurements acquired in a cylindrical setup.
URI: http://hdl.handle.net/10651/51020
ISSN: 2079-9292
Sponsored: This research was partially supported by the “Ministerio de Economía y Competitividad” of Spain/FEDER under grant FPU15/06341; by the Principado de Asturias under project GRUPINN-18-000191; and by the European Union under the framework of the Erasmus+ mobility agreement between the University of Oviedo (E OVIEDO 01) and Hochschule Mannheim (D MANNHEI 03).
Project id.: GRUPIN2018-000191
Appears in Collections:Artículos
Ingeniería Eléctrica, Electrónica, de Computadores y Sistemas
Investigaciones y Documentos OpenAIRE

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