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Evaluation of different strategies for quantitative depth profile analysis of Cu/NiCu layers and multilayers via pulsed glow discharge – Time of flight mass spectrometry

dc.contributor.authorMuñiz Delgado, Rocío
dc.contributor.authorLobo Revilla, Lara 
dc.contributor.authorNémeth, K.
dc.contributor.authorPéter, László
dc.contributor.authorPereiro García, María Rosario 
dc.date.accessioned2017-12-14T11:03:33Z
dc.date.available2017-12-14T11:03:33Z
dc.date.issued2017
dc.identifier.citationSpectrochimica Acta - Part B Atomic Spectroscopy, 135, p. 34-41 (2017); doi:10.1016/j.sab.2017.06.016
dc.identifier.issn0584-8547
dc.identifier.urihttp://hdl.handle.net/10651/44670
dc.description.sponsorshipFinancial support by Project FC-15-GRUPIN14-092 (Principado de Asturias, Spain) is acknowledged. Lara Lobo acknowledges her research contract IJIC-2015-25801 to the Spanish Ministry of Economy, Industry and Competitiveness through Juan de la Cierva-Incorporación Program. László Péter acknowledges the awarding of a grant (funded by Santan-der Bank) for the temporary recruitment of teaching staff to the Univer- sity of Oviedo.
dc.format.extentp. 34-41
dc.language.isoeng
dc.relation.ispartofSpectrochimica Acta - Part B Atomic Spectroscopy
dc.rights©,
dc.sourceScopus
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85021659282&doi=10.1016%2fj.sab.2017.06.016&partnerID=40&md5=c3babbda99ccec6c6fc07d0f228f5151
dc.titleEvaluation of different strategies for quantitative depth profile analysis of Cu/NiCu layers and multilayers via pulsed glow discharge – Time of flight mass spectrometryeng
dc.typejournal article
dc.identifier.doi10.1016/j.sab.2017.06.016
dc.relation.projectIDMINECO/IJIC-2015-25801
dc.relation.publisherversionhttp://dx.doi.org/10.1016/j.sab.2017.06.016


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