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Please use this identifier to cite or link to this item: http://hdl.handle.net/10651/37957

Title: Imaging techniques and scanning electron microscopy as tools for characterizing a Si-based material used in air monitoring applications
Author(s): Suárez Peña, Beatriz
Negral Álvarez, Luis
Castrillón Peláez, Leonor
Megido Fernández, Laura
Marañón Maison, María Elena
Fernández Nava, Yolanda
Issue date: 2016
Publisher version: http://dx.doi.org/10.3390/ma9020109
Citation: Materials, 9(2), p. 109- (2016); doi:10.3390/ma9020109
Format extent: p. 109-
URI: http://hdl.handle.net/10651/37957
ISSN: 1996-1944
Sponsored: The research leading to these results received funding from the Principality of Asturias (Spain) under Grant Agreement SV-PA-13-ECOEMP-65.
Project id.: SV-PA-13-ECOEMP-65
Appears in Collections:Ciencias de los Materiales e Ingeniería Metalúrgica
Investigaciones y Documentos OpenAIRE

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