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Please use this identifier to cite or link to this item: http://hdl.handle.net/10651/37071

Title: Analytical potential of rf-PGD-TOFMS for depth profiling of an oxidized thin film composite
Author(s): González Gago, Cristina
Pisonero Castro, Jorge
Sandín, R.
Fuertes Martínez, José Félix
Sanz Medel, Alfredo
Bordel García, Nerea
Issue date: 2016
Publisher version: http://dx.doi.org/10.1039/c5ja00104h
Citation: Journal of Analytical Atomic Spectrometry, 31(1), p. 288-296 (2016); doi:10.1039/c5ja00104h
Format extent: p. 288-296
URI: http://hdl.handle.net/10651/37071
ISSN: 0267-9477
Sponsored: Spanish Ministry of Science [MAT2010-20921, CTQ2013-49032-C2-2 R]; Spanish Ministry of Economy and Competitiveness and Innovation; Principality of Asturias, "Plan de Ciencia, Tecnologia e innovacion" [FC-15-GRUPIN14-040]; Feder Program
Project id.: MAT2010-20921
CTQ2013-49032-C2-2 R
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