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Repositorio de la Universidad de Oviedo. > Producción Bibliográfica de UniOvi: RECOPILA > Artículos >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10651/30269

Title: Capabilities and limitations of LA-ICP-MS for depth resolved analysis of CdTe photovoltaic devices
Author(s): Gutiérrez González, Ana
González Gago, Cristina
Pisonero Castro, Jorge
Tibbetts, Nicole J.
Menéndez, A.
Vélez Fraga, María
Bordel García, Nerea
Issue date: 2015
Publisher version: http://dx.doi.org/10.1039/c4ja00196f
Citation: Journal of Analytical Atomic Spectrometry, 30(1), p. 191-197 (2015); doi:10.1039/c4ja00196f
Format extent: p. 191-197
URI: http://hdl.handle.net/10651/30269
ISSN: 0267-9477
Appears in Collections:Artículos

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