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Repositorio de la Universidad de Oviedo. > Producción Bibliográfica de UniOvi: RECOPILA > Artículos >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10651/18844

Title: A path towards a better characterisation of silicon thin-film solar cells: Depth profile analysis by pulsed radiofrequency glow discharge optical emission spectrometry
Author(s): Sánchez, Pascal
Fernández García, Beatriz
Menéndez García, Alberto
Gómez Plaza, David
Pereiro García, María Rosario
Sanz Medel, Alfredo
Issue date: 2013
Publisher version: http://dx.doi.org/10.1002/pip.2387
Citation: Progress in Photovoltaics: Research and Applications (2013); doi:10.1002/pip.2387
URI: http://hdl.handle.net/10651/18844
ISSN: 1062-7995
1099-159X
Local identifier: 20130564
Appears in Collections:Artículos

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