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Showing results 1 to 8 of 8
Issue DateTitleAuthor(s)
2009Common-path two-wavelength interferometer with sub-micron precision for profile measurements in on-line applicationsEnguita González, José María; Álvarez García, Ignacio; Frade Rodríguez, María; Marina Juárez, Jorge
2010Common-path two-wavelength interferometer with submicron precision for profile measurements in on-line applicationsEnguita González, José María; Álvarez García, Ignacio; Frade Rodríguez, María; Marina Juárez, Jorge
2011Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometerFrade Rodríguez, María; Enguita González, José María; Álvarez García, Ignacio; Rodríguez Jiménez, Silvia
2012In situ 3D profilometry of rough objects with a lateral shearing interferometry range finderFrade Rodríguez, María; Enguita González, José María; Álvarez García, Ignacio
2013In-Situ Waviness Characterization of Metal Plates by a Lateral Shearing Interferometric ProfilometerFrade Rodríguez, María; Enguita González, José María; Álvarez García, Ignacio
2009On-line metrology with conoscopic holography: Beyond triangulationÁlvarez García, Ignacio; Enguita González, José María; Frade Rodríguez, María; Marina Juárez, Jorge; Ojea Merín, Guillermo
26-Oct-2012Técnicas avanzadas de perfilometría óptica in-situ basada en interferometría de desplazamiento lateral para medidas submicrométricasFrade Rodríguez, María
2009Toward extended range sub-micron Conoscopic Holography profilometers, using multiple wavelengths and phase measurementEnguita González, José María; Álvarez García, Ignacio; Marina Juárez, Jorge; Ojea Merín, Guillermo; Cancelas Caso, José Antonio; Frade Rodríguez, María
Showing results 1 to 8 of 8

 

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